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Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Honda, Mitsunori; Deng, J.*
Photon Factory Activity Report 2012, Part B, P. 68, 2013/00
The orientation of organic semiconducting molecules on surfaces plays a crucial role in improving the properties of electronic devices. We prepared thin films of silicon phthalocyanine dichroride (SiPcCl
) on graphite spin-cast followed by heating to 350
C at ambient condition. We investigate the molecular orientation of the films using angle-dependent near-edge X-ray absorption fine-structure (NEXAFS) spectroscopy. Si 1s NEXAFS spectra for the thin films after annealing are very different each other, indicating that the corresponding reactions thus the structures of final products are different. The structures of the reaction products are estimated with the help of ab initio molecular orbital calculations that fit the observed NEXAFS spectra.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro
Photon Factory Activity Report 2012, Part B, P. 118, 2013/00
We have investigated the electronic property of RR-P3HT (regioregular-poly(3-hexylthiophene)) films with 
- stacking using sulfur K-edge X-ray absorption fine structure (XAFS) spectroscopy. It was observed that the LUMO of - stacking film is lower in energy by 0.3 eV than that of the polycrystalline powder, although these compounds are the same origin. This shift was explained that the interaction between the two molecules in co-facial leads to splitting of the LUMO level to LUMO and LUMO+1, resulting in reduced LUMO energy.